Description: applications and easier suspension in liquids or melts. *** Intended for large and very high-conducting samples. Kapton sensors for thin film measurements, operating temperature from -196 ...

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Ellipsometry is a non-destructive, optical measurement technique that characterizes the optical properties of thin films. It is highly sensitive to changes in the thickness and refractive index of the ...

I READ with interest the description by Gunn and Scott 1 of their method of measuring the thickness of thin films. I have been using the same method for some time, but have found necessary a ...

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The FilmTek™ 3000SE spectroscopic ellipsometer adds transmission measurement capability in addition to spectroscopic ellipsometry and DUV reflectometry. The FilmTek™ 2000SE spectroscopic ellipsometer ...