Intended for large and very high-conducting samples. Kapton sensors for thin film measurements, operating temperature from -196 °C up to 300 °C (400 °C in vacuum): Sensor design: Radius ...

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Ellipsometry is a non-destructive, optical measurement technique that characterizes the optical properties of thin films. It is highly sensitive to changes in the thickness and refractive index of the ...

The FilmTek™ 2000SE spectroscopic ellipsometer utilizes SCI's material modeling software to provide an affordable and reliable thin film measurement tool for the simultaneous measurement of film ...

Thin film equipment is vacuum process equipment for the deposition ... An oxidation furnace is an example of a batch processing system. Some batch systems also have the capability to apply several ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Filmetrics® F40 benchtop thin-film ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Optical NanoGauge Thickness ...