Thin film metrology and wafer inspection for defects are integral to controlling the semiconductor manufacturing process. Film properties, linewidths, and defect levels need to be measured, first to ...

Specifications important when considering thin film equipment include maximum diameter or width of the part to be processed, integral process controller, metrology or thin film monitoring capabilities ...

The XYZ-Theta example stage shown is designed for thin film metrology equipped with direct drive motors, nanometer resolution encoders, and high-performance ACS motion controllers. More ...

We utilize automated deposition equipment, customized thin film design and state of the art metrology equipment. At Arrow Thin Films, providing solutions is an everyday occurrence.

Using thin-film technology in nuclear clocks is commensurate ... Working with the JILA Keck Metrology laboratory and JILA instrument maker Kim Hagen, the researchers reliably reproduced films ...

Thin film metrology and other process control systems also contribute significantly, supporting advanced applications like 3D ICs and MEMS. North America dominated the semiconductor metrology and ...

Founded in 1991, Quality Thin Films is a privately held corporation ... and includes fully equipped fabrication, polishing, and metrology departments, as well as a large, 8-chamber coating lab ...